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The surface morphology of the CI, GO, GO/PABA-CI, GO/Gly-CI and GO/Ala-CI composites was demonstrated by Scanning Electron Microscope (SEM). X-Ray Diffraction (XRD) patterns were recorded using a PANalytical X-ray diffractometer (operated at 40 kV and 150 mA) in a 2θ range of 5 to 90 (Cu-K α radiation, λ = 1.540 Å). Raman spectra of graphene oxide, PABA-CI, Gly-CI, Ala-CI, GO/PABA-CI, GO/Gly-CI and GO/Ala-CI samples were taken using a LabRam HR equipment (532 nm laser source).

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We demonstrate the method of achieving excellent supercapacitance in nitrogen-doped reduced graphene oxide (N-rGO) sheets by controlling the amount of N-content through the use of the different ratios of GO...