Poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate) (PEDOT:PSS) thin films on indium tin oxide and glass substrates have been fabricated and subjected to a non-adiabatic annealing process. The films showed subtle changes in their structure and optical properties as well as an increase in conductivity due to the effects of rapid thermal annealing. Through a combination of Raman spectroscopy, X-ray photoelectron spectroscopy and atomic force microscopy studies in conjunction with electrical characterization, and four-point probe measurements, material enrichment of conductive PEDOT domains at the polymer-metal interface have been demonstrated, which well explains the surface conductivity improvement of a thin film of PEDOT:PSS after annealing.

The effect of nonadiabatic annealing on poly(3,4-ethylendioxythiophene)-poly(styrenesulfonate) (PEDOT-PSS) thin films prepared on silicon substrate has been investigated by Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), and atomic force microscopy (AFM). The analysis indicates the formation of an annealing-induced doping in PEDOT structure, suggesting a modification of the polymer electronic structure and the formation of a PEDOT-rich film surface.

No abstract

No abstract

No abstract