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We presented the effect of annealing temperature on nanocrystallite growth toward zinc oxide (ZnO) nanorods based on the hydrothermal process. The hydrothermal growths of the ZnO nanorods were prepared with zinc nitrate hexahydrate and hexamethylenetetramine solution at 90°C for 6 hours. The structural, morphological, optical, and anti-bacterial properties of the ZnO nanorods, prepared at different annealing temperatures, were characterized by grazing-incidence X-ray diffraction (GIXRD), field-emission scanning electron microscopy (FE-SEM), and UV-Vis spectrophotometer. The GIXRD patterns of the ZnO nanorods corresponded to the wurtzite structure. The FE-SEM results showed that the prepared ZnO nanorods were in the form of the hexagonal shape. The anti-bacterial behaviors of suspension of ZnO nanorods against Escherichia coli (gram-negative) would be discussed in this paper.

Tantalum oxide (TaO) thin films were deposited by dc reactive magnetron sputtering at room temperature. A target of tantalum (99.995%) and a mixture of argon and oxygen gases were used to deposit TaO films on to silicon wafers (100) and BK7 glass substrate. The effects of annealing temperature (300–700 °C) on structural, morphology and anti-bacterial properties were investigated. Grazing incident X-ray diffraction (GIXRD), atomic force microscope (AFM) measurements are carried out to identify the crystalline structure, film morphology and surface roughness, respectively. The antibacterial behavior of the tantalum oxide thin films will be discussed in this paper.