We investigate and report on the kinematics of photoisomerization processes of polymer composite thin films based on azo dye methyl red (MR) hosted in polymethylmethacrylate (PMMA) incorporated with Benzyl dimethyl ketal (BDK) as a photo-initiator. Understanding photoisomerization mechanisms is crucial for several optical applications such as Read/Write/Erase (WRE) optical data storage media, UV light Read/Write heads, and UV light sensors. The as-prepared polymer composite thin films are characterized using UV–Vis spectroscopy. Furthermore, Fourier transform infrared spectroscopy (FTIR) and scanning electron microscope (SEM) are employed to investigate the optical, chemical, and morphological properties of trans- and cis-states of PMMA-BDK-MR polymer composite thin films. The presence of the azo dye MR in the composite is essential for the efficient performance of the cis ↔ trans cycles through illumination ↔ thermal relaxation for Write/Read/Erase optical data storage and UV-light sensors. Moreover, UV–Vis and FTIR results confirm the hysteresis cycle of trans- and cis-states and that PMMA-BDK-MR thin films may be regarded as potential candidates for successful Write/Read/Erase optical data storage and UV-light sensors. In addition, the morphology of the thin film surface is investigated by SEM technique. The SEM images indicate that uncured surfaces of PMMA-BDK-MR thin films are inhomogeneous compared with the corresponding surfaces after curing. The transformation from inhomogeneous surfaces to homogeneous surfaces is attributed to the polymerization of thin films by UV curing.
Sol-gel technique is used to synthesize as-grown zinc oxide (ZnO) and iron-nickel (Fe-Ni) co-doped ZnO thin films deposited on glass substrates using dip coating technique. The structural properties and crystal imperfections of as-prepared thin films are investigated. We performed the structural analysis of films using X-ray diffraction (XRD). The XRD analysis reveal that the as-prepared films exhibit wurtzite structure. Furthermore, XRD-line profile analysis is performed to study the correlation between structural properties and imperfections of the nanocomposite thin films. The crystallite size and microstrains parameters are predicted using the Williamson–Hall method. We found that the crystallites size increases as the co-doped (Fe-Ni) concentration is increased. However, microstrains of the nanocomposite films decreases as (Fe-Ni) concentration is increased. The optical properties of the (Fe-Ni) co-doped nanocomposite films are investigated by performing UV-Vis (250 nm–700 nm) spectrophotometer measurements. We found that as the (Fe-Ni) concentration level is steadily increased, transmittance of the undoped ZnO thin films is decreased. Remarkably, refractive index of undoped ZnO thin films is found to exhibit values extending from 1.55 to1.88 that would increase as (Fe-Ni) concentration is increased.
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