We have synthesized thin films of (Ti1−xNbx)2AlC by combinatorial method on TiC (111) seed layers grown on c-axis sapphire (Al2O3) substrates at 900 °C using magnetron sputter. X-ray diffraction showed the films to be c-axis oriented and epitaxial, and films contained a minor secondary phase of (Ti,Nb)C, irrespective of stoichiometry. Most notably, Raman spectroscopy suggest a sizable increase in the elastic modulus in the Nb-rich region as compared to either of the end members.

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