A screening method is reported for electro-optic (EO) polymers with an emphasis on broadband device suitability. The method is based on comparing the signal from second harmonic generation (SHG) and the leak through current (LTC) during poling. Plots of the SHG and LTC are used to define high EO activity-low current poling windows that are critical for low driving voltage, broadband devices with relatively low optical loss. The screening procedure was used to select an EO polymer core that resulted in a 40Gbits∕s broadband modulator with a driving voltage of 1.3V and an insertion loss of <8dB.

Light diffracted from a grating output coupler in a Ti-diffused LiNbO3 waveguide is scanned electro-optically. Using a coupling length of 2.5 mm in our arrangement we have demonstrated a scanning capability of one resolved spot per 3 V/μm applied field.