An evaluation of energy deposition induced by p-Si nuclear reactions as a function of circuit sensitive thickness and proton incident energy is performed to develop a model which predicts proton-induced SEU cross-sections from heavy ion experiment. A set of experimental validation is presented showing the convenient accuracy of the model.
This paper presents the radiation results of a ground test program carried out on seven commercially available lMbit / 4Mbit SRAMs. Heavy ion and proton single event effect (SEE) results together with CO60 total ionizing dose performance are presented for these spacecraft candidate types.
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