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Utilizing the theory developed by the authors in an earlier publication, the influence of the ellipticity parameter, the dimensionless speed, load, and material parameters on minimum film thickness was investigated. The ellipticity parameter was varied from one (a ball on a plate configuration) to eight (a configuration approaching a line contact). The dimensionless speed parameter was varied over a range of nearly two orders of magnitude. The dimensionless load parameter was varied over a range of one order of magnitude. Conditions corresponding to the use of solid materials of bronze, steel, and silicon nitride and lubricants of paraffinic and naphthenic mineral oils were considered in obtaining the exponent in the dimensionless material parameter. Thirty-four different cases were used in obtaining the minimum film thickness formula given below as H¯min=3.63U0.68G0.49W−0.073(1−e−0.68k) A simplified expression for the ellipticity parameter was found where k=1.03RyRx0.64 Contour plots were also shown which indicate in detail the pressure spike and two side lobes in which the minimum film thickness occurs. These theoretical solutions of film thickness have all the essential features of the previously reported experimental observations based upon optical interferometry.

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The analysis of an isothermal elastohydrodynamic lubrication (EHL) point contact was evaluated numerically. This required the simultaneous solution of the elasticity and Reynolds equations. In the elasticity analysis the contact zone is divided into equal rectangular areas and it is assumed that a uniform pressure is applied over each element. In the numerical analysis of the Reynolds’ equation a phi analysis where phi is equal to the pressure times the film thickness to the 3/2 power is used to help the relaxation process. The EHL point contact analysis is applicable for the entire range of elliptical parameters and is valid for any combination of rolling and sliding within the contact.

Our earlier studies of elastohydrodynamic lubrication of conjunctions of elliptical form are applied to the particular and interesting situation exhibited by materials of low elastic modulus. By modifying the procedures we outlined in an earlier publication, the influence of the ellipticity parameter k and the dimensionless speed U, load W, and material G parameters on minimum film thickness for these materials has been investigated. The ellipticity parameter was varied from 1 (a ball-on-plate configuration) to 12 (a configuration approaching a line contact). The dimensionless speed and load parameters were varied by 1 order of magnitude. Seventeen different cases were used to generate the following minimum- and central-film-thickness relations: H˜min=7.43(1−0.85e−0.31k)U0.65W−0.21H˜c=7.32(1−0.72e−0.28k)U0.64W−0.22 Contour plots are presented that illustrate in detail the pressure distribution and film thickness in the conjunction.