A detailed study of the variation of the thermoelectric figure of merit of
Si–Ge alloys with alloy composition, temperature and carrier density is
the subject matter of this paper. Such a study is of particular interest
at higher temperatures when minority carrier effects (MCEs) start to
play a significant role in degrading the performance, thereby setting an
upper limit of high temperature application. Alloys rich in silicon content
are of greater interest and attention for the obvious reason that silicon,
due to its large energy gap, is important in pushing the MCE to higher
temperatures. The purpose of the present paper is to examine in depth all
those processes that tend to degrade the material performance.
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