This article describes the design of a multielement solid-state detector system for use on the SRS materials science Station 9.3. The detector system is discussed in detail and test data are presented. The current system consists of 13, 8-mm diam, germanium diodes mounted in a single cryostat. The system operates with a 0.5-μs shaping time and achieves better than 200-eV resolution at 5.9 keV. Rate and resolution characteristics of the system are discussed with a view to future improvements in the system.

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A VME-based control and data acquisition system has been constructed for time resolved energy dispersive extended x-ray absorption fine structure. The system is discussed from initial concept to installation on the Daresbury SRS. The system performance is presented in detail together with examples of test data. Current operational characteristics are a 2-ms readout time for one scan of 512 pixels, at 16 bits resolution. Accumulation of 65 000 scans in a single frame and a total of 64 frames stored in memory. The system has been designed to run at rates of 0.2 ms per scan and a burst mode allowing 128 single scan frames to be accumulated.

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Existing Solid State Detector systems exhibit limitations in throughput rate and stability when used with intense synchrotron radiation sources. Recent work on a prototype detector system for Fluorescence EXAFS has allowed evaluation of new techniques, made possible by recent improvements in integrated circuit products. The knowledge gained from this investigation is enabling the design of high-count rate detector systems.