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Although the number of pixels in image sensors is increasing exponentially, production techniques have only been able to linearly reduce the probability that a pixel will be defective. The result is a rapidly increasing probability that a sensor will contain one or more defective pixels. The defect pixel detection and defect pixel correction are operated separately but the former must employ before the latter is in use. Traditional detection scheme, which finds the defect pixels during manufacturing, is not able to discover the spread defect pixels years late. Consequently, the lifetime and robust defect pixel detection technique, which identifies the fault pixels when camera is in use, is more practical and developed. The paper presents a two stages dead pixel detection technique without complicated mathematic computations so that the embedded devices can easily implement it. Using six dead pixel types are tested and the experimental result indicates that it can be accelerated more than four times the detection time.

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