We present the first demonstration of high pressure mass spectrometry (HPMS), which we define as mass spectrometry performed at pressures greater than 100 mTorr. Mass analysis is shown at operational pressures exceeding 1 Torr of helium buffer gas. A differentially pumped MS system was constructed for HPMS development consisting of two chambers. The first chamber (mass analysis chamber) was operated at pressures up to 1.2 Torr and contained the ionization source and a microscale cylindrical ion trap (CIT) mass analyzer. The CIT had critical dimensions of r0 = 500 μm and z0 = 650 μm. The second chamber was held at a lower pressure (≤10 mTorr) and contained an electron multiplier for detection. Mass spectra for xenon, 2-chloroethyl ethyl sulfide (CEES), and octane were acquired with helium buffer gas pressures ranging from 0.04 to 1.2 Torr in the mass analysis chamber. Full-width at half-maximum of mass spectral peaks was found to increase 143% for xenon, 40% for CEES, and 77% for octane over this pressure range, with maximum peak widths of 1.19, 1.26, and 0.82 Da, respectively. Data were fitted with an algebraic model that factors in ion-neutral collision peak broadening effects at high pressures. Experimental and theoretical peak broadening slopes showed good agreement at buffer gas pressures greater than 0.2 Torr. Experiments presented here demonstrate mass spectrometry at pressures orders of magnitude higher than conventionally practiced with any type of mass analyzer. The use of HPMS provides a way to eliminate turbo pumping requirements, leading to significant reduction in MS system size, weight, and power and facilitating a path toward compact/hand-held mass spectrometers with numerous potential applications.

HPMS significantly reduces the pumping requirements required for miniature mass spectrometers and the use of ambient air buffer gas further reduces size, weight, and logistics requirements. Mass analysis at high pressures of ambient air is another important step for the development of hand portable mass spectrometers. Copyright © 2016 John Wiley & Sons, Ltd.