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The dependence of the secondary-ion yield Y on the energy loss dE/dx of fast (MeV/u) primary ions has been measured for organic and inorganic samples. It is found that the dependence of Yon dE/dx can be expressed in the whole dE/dx range investigated (1 dE/dx + 54 keV pg ' cm ) as Y~(dE/dx -5)", where 5 is a threshold energy loss. Di6'erent exponents n exist for positive and negative secondary ions as well as ions desorbed from different samples.

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