Dependence of the heavy-ion-induced desorption yield on the primary-ion energy loss

Brandl, D.; Schoppmann, Ch.; Schmidt, Ralf; Nees, B.; Ostrowski, AN; Voit, H.

doi:10.1103/physrevb.43.5253

Cited by 26 publications

(13 citation statements)

References 19 publications

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“…There is a 'threshold velocity' in the region of 0.2 cm/ns, which is in close agreement with the findings of Hakansson et al [14] There is a maximum value of yield in the 0.6-0.7 cm/ns velocity range. This result agrees with a similar measurement made by Albers et al [15] where it was determined that for a 16 O beam impinging on a target of the amino acid, valine, the maximum value for the yield is achieved at a velocity of about 0.6-0.8 cm/ns. Albers et al argued that the nuclear energy loss (dE/dx) n is roughly proportional to the yields measured at primary ion velocities below 0.2 cm/ns and can be explained using conventional sputter theory.…”

Section: Methodssupporting

confidence: 86%

“…The cluster-SIMS (keV) data are provided by an IonToF GmbH Tof.SIMS5 device equipped with a reflectron mass spectrometer located in the University of Surrey Surface Analysis Laboratory. Mass spectra of a leucine sample deposited on a silicon wafer were acquired using the LTOF device with a beam of 16 O 4+ primary ions focused to a 10 µm spot size at various primary ion energies ranging from 1 to 10 MeV. The primary ions were raster scanned over an area of 500 × 500 µm, and the extraction optics were optimized to provide a uniform collection of secondary ions over the entire scan area.…”

Section: Methodsmentioning

confidence: 99%

“…This beam is generally used for particle-induced X-ray emission spectrometry (PIXE) and Rutherford backscattering (RBS) studies. A mixture of 10% oxygen and 90% hydrogen gas was used in a duoplasmatron source to provide a monoenergetic primary ion beam of 16 O 4+ accelerated with a 2 MV Tandem accelerator to kinetic energies as high as 10 MeV and currents of about 100 pA. The microbeam chamber, which is an octagonal target chamber from Oxford Microbeams Ltd operated at high vacuum conditions held around 1 × 10 5 mbar, has been integrated with both a linear and a reflectron-type mass analyzer to collect, analyze, and detect the secondary ions desorbed by the MeV primary ions.…”

Section: Methodsmentioning

confidence: 99%

“…This interaction results in the socalled pressure-pulse or cylindrical thermal spike [3,18] and then a sputtering process that is less understood than the nuclear sputtering (collision-cascade) mechanism predominantly induced by slower moving keV ions. Our study compares the ToF-SIMS results obtained using Bi + , Bi 3 + , Bi 5 + , and C 60 + keV primary ion sources and MeV 16 O 4+ monomer ion beams on samples of the amino acid leucine, and the large biomolecule Angiotensin II.…”

Section: Introductionmentioning

confidence: 99%

“…For the latter, these parameters include: primary ion energy, [10] charge state, [11] angle of incidence, [12,13] primary ion velocity, [14,15] primary-ion energy loss [16] effective charge, [15] secondary ion desorption yield; and damage cross section [17] .…”

Section: Introductionmentioning

confidence: 99%

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Comparison of MeV monomer ion and keV cluster ToF‐SIMS

Jones

Matsuo

Nakata

et al. 2011

Surface & Interface Analysis

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Recent results [1] show the potential of using monomer primary ions accelerated to several MeV with a tandem accelerator to achieve the necessary secondary ion yields to image large (above 1 kDa) molecules with submicron lateral resolutions. The Surrey ion Beam Centre (Surrey IBC) has designed a time-of-flight secondary ion mass spectrometer (ToF-SIMS) combined with a 2 MV Tandem accelerator to investigate the characteristics of the desorption of secondary ions by the impact of fast, heavy, primary ions. The application of this MeV-ToF-SIMS technique is intended to eventually image biomolecules in the subcellular regime without the need for matrix application associated with other mass spectromery techniques, such as Matrix Assisted Laser Desorption ionisation (MALDI). A discussion is given to point out the merits of using a combination of Particle-Induced X-ray Emission Spectrometry (PIXE) and Rutherford Backscattering (RBS) with the MeV-ToF-SIMS measurement to improve quantification and sensitivity of this surface analysis technique. We also present data from highly focused MeV primary ions to directly compare results obtained using keV cluster-SIMS to measure various biological materials using ToF-SIMS through sputtering in both the nuclear and electronic stopping regimes. Our findings show that the mass spectra obtained with MeV ions in the electronic stopping regime show similarities to those acquired with more conventional keV ion beams (e.g. Bi + , Bi 3 + , Bi 5 + and C 60 + ). MeV-ToF-SIMS has the potential for becoming a widely used quantitative surface analysis technique in the many ion beam analysis facilities already conducting-high energy ion beam analyses.

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Section: Methodssupporting

confidence: 86%

Section: Methodsmentioning

confidence: 99%

Section: Methodsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Comparison of MeV monomer ion and keV cluster ToF‐SIMS

Jones

Matsuo

Nakata

et al. 2011

Surface & Interface Analysis

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Water‐Soluble Self‐Assembled Butadiyne‐Bridged Bisporphyrin: A Potential Two‐Photon‐Absorbing Photosensitizer for Photodynamic Therapy

Ogawa

Satake

et al. 2007

Chemistry A European J

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We have synthesized a novel, two-photon-absorbing photosensitizer for two-photon-absorption photodynamic therapy (2PA-PDT). The molecule is a butadiyne-bridged porphyrin dimer terminated with two water-soluble porphyrin monomers connected through Zn-imidazolyl self-assembly and covalently linked through olefin metathesis. It has an effective two-photon-absorption (2PA) cross-section value, sigma((2)), of 33 000+/-4600 GM with 5-ns pulses at 890 nm measured by using the open-aperture Z-scan technique. The compound was found to generate singlet oxygen, cytotoxic for tumor cells in photodynamic therapy (PDT), under 2PA conditions by conducting photobleaching experiments with anthracene-9,10-dipropionic acid sodium salt (ADPA).

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Particle‐induced desorption in mass spectrometry. Part I. Mechanisms and processes

Demirev

1995

Mass Spectrometry Reviews

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Desorption of (predominantly) organic molecules, induced by particles with keV to MeV energy incident on a condensed phase target, is the topic of this review. The focus is on MeV atomic ion‐induced desorption–plasma desorption (PD). Parallels with keV particle desorption–secondary ion mass spectrometry (SIMS) and fast atom bombardment (FAB)–will be presented more schematically and chiefly for comparison purposes. Current understanding of desorption mechanisms by referring to insights from theory of the processes is surveyed, and the underlying similarities as well as differences between keV and MeV particle desorption are addressed. Several connections between particle‐induced desorption and photon‐induced desorption (e.g., matrix‐assisted laser desorption/ionization‐MALDI) are briefly outlined. Results from computer simulations are used to visualize the dynamics of the desorption process. A brief description of experimental characteristics of desorbed species, aimed at elucidating the mechanisms of desorption, is given, partly to illustrate the use of mass spectrometry in fundamental studies of ion–solid interactions. Ionization pathways in PD and molecular SIMS are briejy summarized. No special emphasis is placed in describing the “generic” instrumental setup f o r particle desorption and only specific technical aspects, not treated elsewhere, eg., time and spatial correlation of the ejected species, are discussed here. In the second part of this review (subsequent article) desorption induced by polyatomic projectiles, and effects, accompanying ion ejection, namely secondary electron emission, impact‐induced photon emission, and sputtering of clusters (fullerenes in particular), are also reviewed. In conclusion, selected examples for analytical applications of desorption methods that may illustrate current and emerging trends and perspectives are discussed. © 1996 John Wiley & Sons, Inc.

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Dependence of the heavy-ion-induced desorption yield on the primary-ion energy loss

Cited by 26 publications

References 19 publications

Comparison of MeV monomer ion and keV cluster ToF‐SIMS

Comparison of MeV monomer ion and keV cluster ToF‐SIMS

Water‐Soluble Self‐Assembled Butadiyne‐Bridged Bisporphyrin: A Potential Two‐Photon‐Absorbing Photosensitizer for Photodynamic Therapy

Particle‐induced desorption in mass spectrometry. Part I. Mechanisms and processes

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