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Variation of the reflectance of the aluminized tip of a near-field scanning optical microscope is used to measure the temperature rise due the confinement of light in the tip. The measurement technique involves a pump-probe beam approach, and uses a two-step process which eliminates the need to know the dependence of the signal on the scattering cross section of the tip.

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The sensitivity of a solid state detector array varies as a result of changes in transmission, diffusion effects and scattering. This variation will occur on a scale length less than that of a single pixel and its knowledge is of importance for improved device design and in applications such as event centroiding in photon counting systems. This paper reports on a measurement of sensitivity variation on a sub-pixel scale for a two-phase front-illuminated CCD. The measurement was made using a scanning reflection microscope. Variation in sensitivity between the phases within a pixel and on much smaller spatial scale are clearly observed as well as crosstalk.