Electroluminescence from a single quantum dot within the intrinsic region of a p-i-n junction is shown to act as an electrically driven single-photon source. At low injection currents, the dot electroluminescence spectrum reveals a single sharp line due to exciton recombination, while another line due to the biexciton emerges at higher currents. The second-order correlation function of the diode displays anti-bunching under a continuous drive current. Single-photon emission is stimulated by subnanosecond voltage pulses. These results suggest that semiconductor technology can be used to mass-produce a single-photon source for applications in quantum information technology.

Despite sustained research, application of lead halide perovskites in field-effect transistors (FETs) has substantial concerns in terms of operational instabilities and hysteresis effects which are linked to its ionic nature. Here, we investigate the mechanism behind these instabilities and demonstrate an effective route to suppress them to realize high-performance perovskite FETs with low hysteresis, high threshold voltage stability (ΔVt < 2 V over 10 hours of continuous operation), and high mobility values >1 cm2/V·s at room temperature. We show that multiple cation incorporation using strain-relieving cations like Cs and cations such as Rb, which act as passivation/crystallization modifying agents, is an effective strategy for reducing vacancy concentration and ion migration in perovskite FETs. Furthermore, we demonstrate that treatment of perovskite films with positive azeotrope solvents that act as Lewis bases (acids) enables a further reduction in defect density and substantial improvement in performance and stability of n-type (p-type) perovskite devices.

Spin dynamics of photoexcited carriers in GaAs/Al x Ga 1Ϫx As quantum wells have been investigated in a wafer containing twelve different single quantum wells, allowing full investigation of well-width and temperature dependences with minimal accidental variations due to growth conditions. The behavior at low temperatures is dominated by excitonic effects, confirming results described in detail by others. Between 50 and 90 K there is a transition from excitonic to free-carrier-dominated behavior; both the temperature and time scale of the transition are in excellent agreement with a theoretical model for exciton dissociation. Above 90 K we find two-component spin decays consisting of an unresolved component ͑faster than 2 ps͒ associated with exciton dissociation and hole spin-relaxation and a longer-lived component that yields the electron spin-relaxation time. In the free-carrier regime, the electron spin-relaxation rate in wide wells follows that for bulk GaAs, which varies approximately as T 2 . For narrow wells the rate is approximately independent of temperature and varies quadratically with confinement energy. This behavior is consistent with dominance of the D'yakonov-Perel mechanism of electron-spin relaxation and the expected behavior of the electron mobility. The data show evidence of the influence of electron scattering by interface roughness.

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