Modulation transfer function (MTF) metrology and interpretation for digital image capture devices has usually concentrated on mid-to high-frequency information, relative to the half-sampling frequency. These regions typically quantify characteristics and operations such as sharpening, limiting resolution, and aliasing. However, a potential wealth of low-frequency, visually significant information is often masked in existing measurement results because of spatial data truncation. For print or document scanners, this influences measurements in the spatial frequency range of 0 to 2.0 cycles/mm, where the effects of veiling flare, micro flare, and integrating cavity effect (ICE) often manifest themselves. Using a form of edge-gradient analysis based on slanted edges, we present a method for measurement of these characteristics. By carefully adapting this well-established technique, these phenomena can be quantified. We also show how, in many cases, these effects can be treated as other spread-function or device-MTF components. The theory and field metrology of several devices using the adapted technique are also presented.
One of the first ISO digital camera standards to address image microstructure was ISO 12233, which introduced the SFR, spatial frequency response, based on the analysis of edge features in digital images. The SFR, whether derived from edges or periodic signals, describes the capture of image detail as a function of spatial frequency. Often during camera testing, however, there is an interest in distilling SFR results down to a single value that can be compared with acceptable tolerances. As a measure of limiting resolution, it has been suggested that the frequency at which the SFR falls to, e.g., 10%, can be used. We use this limiting resolution to introduce a sampling efficiency measure, being considered under the current ISO 12233 standard revision effort. The measure is the ratio of limiting resolution frequency to that implied by the image (sensor) sampling alone. The rationale and details of this measure are described, as are example measurements. One-dimensional sampling efficiency calculations for multiple directions are included in a two-dimensional analysis.
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