We investigated oxide TFT backplane technology to employ the internal gate driver IC (GIP circuit) on 55” 4K OLED TV panel. For the GIP circuit, we developed the high reliability oxide TFTs, especially only ∆0.4 V Vth degradation under 100‐h long‐term PBTS stress and the short channel length TFTs (L = 4.5um) for narrow bezel. Consequently, we demonstrated the 55‐in 4K OLED TV employing the internal gate IC with high reliability and short channel IGZO TFTs.
We investigated oxide TFT backplane technology to
employ the internal gate driver IC (GIP circuit) on 55”
4K OLED TV panel. For the GIP circuit, we developed
the high reliability oxide TFTs, especially only ∆0.4V
Vth degradation under 100‐hour long‐term PBTS stress
and the short channel length TFTs (L=4.5um) for
narrow bezel (5.5mm). Consequently, we demonstrated
the 55‐in 4K OLED TV employing the internal gate IC
with high reliability and short channel IGZO TFTs.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.