In this paper, we describe TSOtool, a program to check the behavior of the memory subsystem in a shared memory multiprocessor. TSOtool runs pseudo-randomly generated programs with data races on a system compliant with the Total Store Order (TSO) memory consistency model; it then checks the results of the program against the formal TSO specification. Such analysis can expose subtle memory errors like data corruption, atomicity violation and illegal instruction ordering.While verifying TSO compliance completely is an NPcomplete problem, we describe a new polynomial time algorithm which is incorporated in TSOtool. In spite of being incomplete, it has been successful in detecting several bugs in the design of commercial microprocessors and systems, during both pre-silicon and post-silicon phases of validation.
In this paper, we look into the problem of datapath synthe sis in a full custom environment and identify various quality metrics which have a dominant effect on the final layout. In the process, we do an in-depth study of the problem of transistor-level placement for datapath cells and develop a prototype tool to test our concepts. Results obtained at this stage, in a reasonable number of testcasea, compare fairly well (within 5% to 15%) against their manually generated counterparts.
In this paper, we describe TSOtool, a program to check thebehavior of the memory subsystem in a shared memorymultiprocessor. TSOtool runs pseudo-randomly generatedprograms with data races on a system compliant with theTotal Store Order (TSO) memory consistency model; it thenchecks the results of the program against the formal TSOspecification. Such analysis can expose subtle memory errorslike data corruption, atomicity violation and illegalinstruction ordering.While verifying TSO compliance completely is an NP-completeproblem, we describe a new polynomial timealgorithm which is incorporated in TSOtool. In spite of beingincomplete, it has been successful in detecting several bugs inthe design of commercial microprocessors and systems,during both pre-silicon and post-silicon phases of validation.
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