We report direct experimental evidence of the collective super-radiant mode in Bragg structure containing 60 InAs monolayer-based quantum wells (QWs) periodically arranged in GaAs matrix. Time-resolved photoluminescence measurements reveal an appearance of the additional super-radiant mode, originated from coherent collective interaction of QWs. This mode demonstrates a super-linear dependence of the intensity and radiative decay rate on the excitation power. The super-radiant mode is not manifested in the case if only a small number of QWs is excited.

Heterostructures with multiple strongly coupled quantum wells, such as super-multiperiod (SMP) superlattices (SLs), are promising semiconductor devices, which may contain hundreds or even thousands of layers with 100 or more periods synthesized by molecular beam epitaxy (MBE) to high structural perfection. The proposed characterization method employs matched application of high-resolution x-ray diffractometry (XRD), reflectometry (XRR), and, for the first time, the deep XRR (DXRR) allows the study of SMP structures, as well as high-accuracy determination of the thicknesses of layers, roughness/diffuseness of boundaries using the rigorous scattering theory, and composition of solid solutions. Combining these methods with scanning transmission electron microscopy (STEM) enables characterization of SMP SLs and independent determination of these same parameters. The differences between the expected and obtained layer thicknesses by XRD and XRR were 1%-3% for AlGaAs/GaAs structures. The samples were characterized by sharp interfaces with the root-mean-square width of the transition layers of the order of a few Å, which is consistent with the XRR/DXRR and STEM analysis. Based on the data obtained for the thicknesses of layers, the composition of Al 0.3 Ga 0.7 As has been accurately determined by the x-ray methods. These results may be considered as the first step in the analysis of MBE-grown SMP structures with a number of periods up to 1000.

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III–V planar semiconductor heterostructures based on GaPN alloy with a nitrogen concentration up to 2.12% were grown on Si(001) by plasma assisted molecular beam epitaxy. Dependence of nitrogen incorporation on the growth conditions and its effect on the crystal structure were investigated via analysis of X-ray diffraction, transmission electron microscopy, and Raman spectroscopy data. Continuous redshift and a substantial increase in intensity of the photoluminescence emission spectra were observed upon increase of nitrogen content. The effect of antiphase disorder in GaP buffer on the GaPN epilayer properties was studied. It was found that antiphase boundaries, protruding from the GaP/Si to the GaPN/GaP heterointerface, change their orientation and self-annihilate in the dilute nitride layer even with a low (0.5%) nitrogen content.

We report time‐resolved photoluminescence (TRPL) measurements performed at different temperatures for the Bragg structure containing 60 InAs monolayer‐based quantum wells (QWs) periodically arranged in a GaAs matrix. TRPL data reveal an appearance of the additional superradiant (SR) mode originated from coherent collective interaction of QWs. The SR mode is not manifested in the case if a small number of QWs is excited, then only an exciton emission related to the InAs QWs dominates the PL spectrum. The SR mode demonstrates a superlinear dependence of the intensity and radiative decay rate on the excitation power and its intensity increases at elevated temperatures compared to the excitonic emission. The photoluminescence delay time is much shorter for the SR mode indicating that the relaxation of hot excitons can occur via stimulated scattering processes. The specific behavior of the SR emission can have a strong potential for different applications such as optical logic devices, superluminescent diodes, optical switches, and low‐threshold lasers. Time‐resolved photoluminescence image at low temperature for the Bragg structure consisting of InAs monolayer‐based quantum wells (inset).