Accurate measurement of the exciton diffusion length in a conjugated polymer using a heterostructure with a side-chain cross-linked fullerene layer Markov, Denis E.; Amsterdam, Emiel; Blom, Paul W.M.; Sieval, Alexander B.; Hummelen, Jan C. Take-down policy If you believe that this document breaches copyright please contact us providing details, and we will remove access to the work immediately and investigate your claim.Downloaded from the University of Groningen/UMCG research database (Pure): http://www.rug.nl/research/portal. For technical reasons the number of authors shown on this cover page is limited to 10 maximum. Groningen, Nijenborgh 4, 9747 AG Groningen, The Netherlands, and Biomade Technology Foundation, Nijenborgh 4, 9747 AG Groningen, The Netherlands ReceiVed: February 24, 2005; In Final Form: April 22, 2005 Exciton diffusion and photoluminescence quenching in conjugated polymer/fullerene heterostructures are studied by time-resolved photoluminescence. It is observed that heterostructures consisting of a spin-coated poly(pphenylene vinylene) (PPV)-based derivative and evaporated C 60 are ill-defined because of diffusion of C 60 into the polymer, leading to an overestimation of the exciton diffusion length. This artifact is resolved by the use of a novel, thermally side-chain polymerizing and cross-linking fullerene derivative (F2D) containing two diacetylene moieties, forming a completely immobilized electron acceptor layer. With this heterostructure test system, an exciton diffusion length of 5 ( 1 nm is derived for this PPV derivative from time-integrated luminescence quenching data.

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