Non-volatile resistive memory cells are promising candidates to tremendously impact the further development of Boolean and neuromorphic computing. In particular, nanoscale memory-bit cells based on electromigration (EM)-induced resistive switching in monolithic metallic structures have been identified as an appealing and competitive alternative to achieve ultrahigh density while keeping straightforward manufacturing processes. In this work, we investigate the EM-induced resistance switching in indented Al microstrips. In order to guarantee a large switching endurance, we limited the on-to-off ratio to a minimum readable value. Two switching protocols were tested, (i) a variable current pulse amplitude adjusted to ensure a precise change of resistance, and (ii) a fixed current pulse amplitude. Both approaches exhibit an initial training period where the mean value of the device's resistance drifts in time, followed by a more stable behavior. Electron microscopy imaging of the devices show irreversible changes of the material properties from the early stages of the switching process. High and low resistance states show retention times of days and endurances of ∼10 3 switching cycles.
Graphene is a promising substrate for future spintronics devices owing to its remarkable electronic mobility and low spin-orbit coupling. Hanle precession in spin valve devices is commonly used to evaluate the spin diffusion and spin lifetime properties. In this work, we demonstrate that this method is no longer accurate when the distance between inner and outer electrodes is smaller than six times the spin diffusion length, leading to errors as large as 50% for the calculations of the spin figures of merit of graphene. We suggest simple but efficient approaches to circumvent this limitation by addressing a revised version of the Hanle fit function. Complementarily, we provide clear guidelines for the design of four-terminal spin valves able to yield flawless estimations of the spin lifetime and the spin diffusion coefficient.
Topology is a crucial ingredient for understanding the physical properties of superconductors. Magnetic field crowds to adopt the form of a topologically-protected quantum flux lines which can lose this property when moving at high velocities. These extreme conditions can be realized when superconductors undergo a thermomagnetic instability for which the sample topology come also into play. In this work, utilizing the magneto-optical imaging technique, we experimentally study magnetic flux avalanches in superconducting films with multiply-connected geometries, including single and double rings. We observe a domino effect in which avalanches triggered at the outer ring, stimulate avalanches at the inner ring thus impairing the expected magnetic shielding resulting from the outer ring and gap. We implement numerical simulations in order to gain more insight into the underlying physical mechanism and demonstrate that such event is not caused by the heat conduction, but mainly attributed to the local current distribution variation near the preceding flux avalanche in the outer ring, which in turn has a ripple effect on the local magnetic field profile in the gap. Furthermore, we find that the domino effect of thermomagnetic instabilities can be switched on/off by the environmental temperature and the gap width between the concentric rings. These findings provide new insights on the thermomagnetic instability in superconducting devices with complex topological structures, such as the superconductor-insulator-superconductor (SIS) multilayer structures of superconducting radio-frequency (SRF) cavities.
Control of magnetization reversal processes is a key issue for the implementation of magnetic materials in technological applications. The modulation of shape magnetic anisotropy in nanowire structures with a high aspect ratio is an efficient way to tune sharp in-plane magnetic switching. However, control of fast magnetization reversal processes induced by perpendicular magnetic fields is much more challenging. Here, tunable sharp magnetoresistance changes, triggered by out-of-plane magnetic fields, are demonstrated in thin permalloy strips grown on LaAlO 3 single crystal substrates. Micromagnetic simulations are used to evaluate the resistance changes of the strips at different applied field values and directions and correlate them with the magnetic domain distribution. The experimentally observed sharp magnetic switching, tailored by the shape anisotropy of the strips, is properly accounted for by numerical simulations when considering a substrate-induced uniaxial magnetic anisotropy. These results are promising for the design of magnetic sensors and other advanced magnetoresistive devices working with perpendicular magnetic fields by using simple structures.
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