The dynamics of doped charge in an antiferromagnetic lattice is central to the description of the insulator-metal transition that occurs on doping the parent high T(c) compounds. In this work we use high resolution resonant inelastic x-ray scattering to investigate the dynamics of the charge-transfer exciton by measuring its energy dispersion in two prototype compounds, La2CuO4 and La2NiO4. We show that this behavior is radically different in the cuprate with respect to a system known to exhibit strong polaronic behavior, namely, the nickelate: the exciton is mobile in the cuprate while it is well localized in the nickelate. Using a simple Wannier-Mott model we can estimate the total hole plus electron effective mass in the cuprate to be 3.5 +/- 0.3 m(e) which would exclude strong localization in the undoped cuprate.

Resonant inelastic X-ray scattering with very high energy resolution is a promising technique for investigating the electronic structure of strongly correlated materials. The demands for this technique are analyzers which deliver an energy resolution of the order of 200 meV full width at half-maximum or below, at energies corresponding to the K-edges of transition metals (Cu, Ni, Co etc.). To date, high resolution under these conditions has been achieved only with diced Ge analyzers working at the Cu K-edge. Here, by perfecting each aspect of the fabrication, it is shown that spherically bent Si analyzers can provide the required energy resolution. Such analyzers have been successfully produced and have greatly improved the energy resolution in standard spherically bent analyzers.