The influence of CuO addition on what of the (Ba,Sr)TiO3 ceramics was studied. The sintering temperature of (Ba,Sr)TiO3 ceramics was lowered by the addition of CuO additives. The 1 -5 wt% CuO were selected and employed as the sintering aids. Low-Temperature Co-fired Ceramic technologies are popular technologies used in the manufacture of microwave devices. In this study, crystalline and electrical properties of CuO doped (Ba,Sr)TiO3 ceramics were investigated to determine the low temperature sintering properties. The addition of CuO to (Ba,Sr)TiO3 lowered the sintering temperature from 1350℃ to 1150℃. The dependence of the sintering temperature shrinkage rate and mechanism of CuO doped (Ba,Sr)TiO3 ceramics are investigated and discussed. Also, the crystalline structure of CuOdoped (Ba,Sr)TiO3 ceramics is discussed by the X-ray diffraction (XRD) method.

Low loss perovskite niobates and tantalates have been placed on a short list of functional materials for future technologies. In this study, we fabricated Ag(Ta,Nb)O3 thick films on the Al2O3 substrates by the screen printing method. The Ag(Ta,Nb)O3 powders were fabricated by the mixed oxide method. The sintering temperature and time were 1150°C and 2 hrs, respectively. The results of XRD analysis showed that the specimens employed in this study had the pesudo cubic structure. The dielectric permittivity and loss tangent of the films have been characterized from 1 kHz to 1 MHz. Also the dielectric permittivity and loss tangent were measured from 303 K to 393 K. The electrical properties of the film are also discussed.

In this paper, fabricated by MEMS uncooled micro-bolometer detector for the study in the infrared sensitivity enhancement. Absorption layer SiOx-Metal series MDTF (metal-dielectric thin film) by high absorption rate and has a high thermal coefficient of resistance, low noise characteristics were implemented. Then MDTF were made in a vacuum deposition method. And MDTF for the analysis of the physical properties of silicon wafers were fabricated, TCR (temperature coefficient of resistance) value was made in order to measure the glass wafer and FT-IR (Fourier Transform Infrared spectroscopy) values were made in order to measure the germanium window. The analyzed results of MDTF -3 [%/ K] has more characteristics of the TCR. And 8∼12 um wavelength region close to 70% in the absorption characteristic.