Quantum materials have attracted much attention in recent years due to their exotic and incredible properties. Among them, van der Waals materials stand out due to their weak interlayer coupling, providing easy access to manipulating electrical and optical properties. Many fascinating electrical, optical, and magnetic properties have been reported in the moiré superlattices, such as unconventional superconductivity, photonic dispersion engineering, and ferromagnetism. In this review, we summarize the methods to prepare moiré superlattices in the van der Waals materials and focus on the current discoveries of moiré pattern-modified electrical properties, recent findings of atomic reconstruction, as well as some possible future directions in this field.

All-optical switches have been considered as a promising solution to overcome the fundamental speed limit of the current electronic switches. However, the lack of a suitable third-order nonlinear material greatly hinders the development of this technology. Here we report the observation of ultrahigh third-order nonlinearity about 0.45 cm2/GW in graphene oxide thin films at the telecommunication wavelength region, which is four orders of magnitude higher than that of single crystalline silicon. Besides, graphene oxide is water soluble and thus easy to process due to the existence of oxygen containing groups. These unique properties can potentially significantly advance the performance of all-optical switches.

In two dimensional (2D) transition metal dichalcogenides, defect-related processes can significantly affect carrier dynamics and transport properties. Using femtosecond degenerate pump-probe spectroscopy, exciton capture, and release by mid-gap defects have been observed in chemical vapor deposition (CVD) grown monolayer MoSe 2 . The observed defect state filling shows a clear saturation at high exciton densities, from which the defect density is estimated to be around 0.5 × 10 12 /cm 2 . The exciton capture time extracted from experimental data is around~1 ps, while the average fast and slow release times are 52 and 700 ps, respectively. The process of defect trapping excitons is found to exist uniquely in CVD grown samples, regardless of substrate and sample thickness. X-ray photoelectron spectroscopy measurements on CVD and exfoliated samples suggest that the oxygenassociated impurities could be responsible for the exciton trapping. Our results bring new insights to understand the role of defects in capturing and releasing excitons in 2D materials, and demonstrate an approach to estimate the defect density nondestructively, both of which will facilitate the design and application of optoelectronics devices based on CVD grown 2D transition metal dichalcogenides.