The boronizing experiments on the surface of Ti-6Al-4V (TC4) titanium alloys were based on solid powder method. Different additives were added into the boronizing agent. The morphologies of surface layers on titanium alloys were observed in scanning electron microscopy (SEM). The phase compositions of boronized layers were analyzed by X-ray diffraction (XRD). The wear resistance properties of boronized TC4 were determined by the friction and wear testing machine. The results showed that all the boronized layers were composed of TiB2and TiB dual phases.When 5%Fe3O4was added into the boronizing agent, the boride layer contained more TiB2compound and was thicker than those with the addition of 5%Na2B4O7.

This work reported on exploring a low cost preparation technology for coated conductor. The epitaxial of La0.4Sr0.6TiO3 conductive buffer layer on NiW substrate was achieved by metal organic deposition. Excellent in-plane and out of plane alignment is confirmed via XRD. YBCO film was fabricated by electrophoretic deposition (EPD). We used buffered (LSTO) Ni-W substrate and Ni plate as cathode and anode respectively. The critical current density of YBCO coating is more than 1000A/cm2 (0T, 77K).

Solid powder boriding experiment was carried out on TC4 titanium alloy surface with method of RE(rare earth)-boriding at the temperature of over 1000°C. By means of XRD, SEM and EDS, phase composition, microstructure and morphology of TC4 titanium alloy after RE-boriding were investigated. The effect of rare earth on phase composition was discussed. Results of the experiment showed that the diffusion layer was composed of top-layer TiB2 and sub-layer TiB whiskers with the highest thickness being 25μm. The XRD results revealed TiB-TiB2 biphasic B-Ti compounds layer formed on the surface of TC4 after RE-boriding. The high content of B and Ce in the surface layer showed rare earth increased the absorption and concentration of B atoms.

Ti6Al4V (TC4) slices were boronized with rare earth oxide (RE) addition in the agent at 950°C (below β phase transus of TC4). The morphology, phases, properties and structures of TC4 matrix and boride layers were studied. The results show that the boride layer on the surface of TC4 consists of TiB2 and TiB dual compounds. The boride layer is compact, uniform and less porous compared with that obtained at 1050°C (above β phase transus of TC4), and the hardness profile and brittleness of the layers are improved to a certain extent. Lower temperature boronizing can effectively prevent the growth of coarse β phase grains. Duplex microstructure is obtained in TC4 matrix, and the work piece distortion is reduced.

MgB2 powder was fabricated by sintering the mixture of pure Mg and B powder with atomic ratio of Mg : B=1:2. The magnetic property of the powder indicated that it was superconducting and its critical transition temperature was 39K. Titanium based MgB2 films were obtained by electrophoretic deposition method using Ni sheet as anode and titanium tapes as cathode. The films were annealed at 500°C for 2 hours, subjected to argon-hydrogen (95%Ar+5%H2) gas flow. The results of X-ray diffraction (XRD) analysis showed that the composition of the film was mainly MgB2. The observation under scanning electron microscopy (SEM) showed that the film of MgB2 was uniform and dense. The electrical resistivity of double-side MgB2 film was about 5.280×10-8Ω/m.