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The reduction of NO with CO over the uranium oxide catalyst and its mixed catalysts with alkali metal oxide or alkaline earth metal oxide has been investigated using conventional flow and pulse reactors at temperatures of 250 to 450 °C under atmospheric pressure. The activity of the uranium oxide catalyst without any additive was higher than that of the Fe2O3 catalyst, although it was inferior to that of the CuO–Cr2O3 catalyst. The addition of alkali metal oxide or alkaline earth metal oxide to uranium oxide, particularly in the case of Cs2O or K2O, was effective in enhancing the catalyst activity. The W/F-conversion curves revealed that the reduction of NO to N2 proceeds consecutively, passing through N2O as a gas-phase intermediate. The reaction rates were formulated as r=kPCO1.0PNO0.4. The kinetic study suggested a redox reaction sequence. The oxidation states of the catalysts were discussed on the basis of X-ray diffractograms.

Abstract— The source (or data) bus‐line to common (or backplane) electrode coupling effect in TFT‐LCDs has been investigated through experiment and simulation using a new model. The important feature of this simulated model is that the common electrode consists of a network of discrete resistors. The horizontal crosstalk is caused by this coupling effect, and the mechanism of the crosstalk has become clear by the simulation of 5‐in. TFT‐LCDs. By adopting this simulation, useful information for large‐area TFT‐LCD designs can be obtained. As an example, this simulation has been performed for 10‐ and 15‐in. TFT‐LCDs and the requirement for a common resistance has been illustrated.

With a view to suppressing the overlap shift between the TFT substrate and the color filter substrate, application of UV sealant is considered in the LCD panel assembly process. The initial tensile strength and moisture resistance of the UV sealant are evaluated and studied. In regard to the initial tensile strength, the stress applied to the sealing part during the glass cutting process, in which the peeling of the seal is most likely, is quantized by a numerical method based on the finite element method. By comparison of this result with tensile intensity tests of the UV sealant, acceptable performance is confirmed. The resistance to moisture is degraded due to large distortions on the interface between the sealant and the glass substrate, since a UV sealant hardened only by UV light has a large shrinkage on solidifying. Such shrinkage is small in a UV sealant that is hardened completely by applying heat after illumination of UV light, and hence presents practically no problem, with a moisture resistance equal to that in conventional heat curing‐type sealant. From these results, the UV sealant completely hardened by applying heat after UV light illumination is found to be applicable to TFT‐LCD from the point of view of tensile strength and humidity resistance. © 2000 Scripta Technica, Electron Comm Jpn Pt 2, 83(5): 21–27, 2000

With the aim of developing a wide viewing angle Liquid Crystal Display (LCD), we are trying to apply In-Plane Switching (JPS) mode, in which liquid crystal molecules are switched by a lateral electric field, to TFT-LCD. We have studied the detailed relationship between the electro-optical properties and the various panel conditions. From these results, we specified the panel conditions, such as +10.4 dielectric anisotoropy of liquid crystal material, 3.5 tm panel gap and 8 .tm electrode spacing, to fabricate the IPS mode Tfl panel.We have achieved the IPS mode TFT color panel that possessed not only wide viewing angle characteristics over 80 °with no reversed image but also a fast response time 50ms , a low driving voltage compatible with ordinary Twisted Nematic (IN) mode TFT panel and a fine white balance,(x,y)=(032,034).