The types of functional VLSI chips needed for general and special purpose (computationally intensive) applications are wide ranging, Hence, to reduce the turn-around time of these VLSI chips, mask/field programmable PLAs, gate arrays SLAs and FPGAs are available. However these VLSI arrays are unsuitable for designing ultrahigh performance special purpose VLSI chips. There is a strong need for developing a suitable mask programmable VLSI structures exclusively for designing ultrahigh performance and cost-effective special purpose systems. For this purpose, a macro cell based mask programmable Pacube (PA3—Programmable Array of Array Adders) VLSI array is proposed in this paper. These arrays can be mask programmed for building cost-effective super computing VLSI functional units. Another important feature is the architecture of the macro-cell, which is designed in such a way that the functional units corresponding to the G-set equations when mapped on the macro-cell arrays possess identical data flow control. This leads to a highly simplified control design for executing complex computations.
In this paper, guarded evaluation is a dynamic power reduction technique by identifying sub circuits inputs and kept constant at specific times during circuit operation. In certain condition, some signals within the digital design are not observable at output. So make such signals as guarded (constant). There by reducing the dynamic power. Here we apply this technique for all digital circuits. The problem here is to find conditions under which a sub circuit input can be held constant with disturbing the main circuit functionally (correctness). Here we propose a solution for discovering the gating inputs based on inverting and non-inverting methods. By including “clock gating” we still reduce the dynamic power and leakage power especially for sequential circuits and also used to some small combinational circuits.
In this paper a low-power pulse-triggered structure and a modified true single latch structure based on a signal feed-through scheme is designed in TSMC CMOS 180 nm technology. The Pulse triggered flip-flop (P-FF) solves the problem of long discharging path and achieves better speed and power performance. The pre and post lay-out simulations has been done using Cadence tool, the performance analysis on power-delayproduct metrics are obtained through simulation and finally a 4-bit RAM is designed by using P-FF and then the implementation has been done on SOC 11.10 technology.
In this report, a Duty Approximate Testing framework is introduced that generates modulation schemes for only separate faults. The fundamental idea is to draw up a list of flaws that may be overlooked or left unproven. The current issues are tested by generating modulation schemes for certain flaws. We examine the implications of skipping any faults by adding glued errors at the circuit’s proper position. With a system limitation standard, the output standard deviation is calculated. In the near past, the FPGA method was a leading method of addressing dynamic automated system architecture or systems. Multiple timers operate the devices in all full-duplex modes. This report examines responsibility to fix multipurpose structures on FPGA for just a grid of dynamic and partially located coordinated balanced regular intervals. For both the FPGA, throughout the irregular clock operation model, the modular component reconstruction system’s load balancing based on the remote monitoring method is used.Furthermore, DPR uses the open-goal approach’s proposed technique to eliminate the flaws throughout processing in the presence of damages. The DPR cuts the lifespan, and device storage is saved by limited restructuring in concurrent FPGA computing. The power consumption of the development method is very significant for many clock realms and throughout the grid. The balanced development consistency is compared with the concurrent balanced matrix to measure the DPR’s reliability. It is also noted that even the fault-tolerant DPR for FPGAs is highly efficient and reliable. The experimental finding shows that irrespective of the flawed findings obtained, such electronics can be used in some kinds of fault structures such as video editing, image recognition, and digital communication. The number of fault positions is reduced by 15-25% concerning both of those benefit, leading to a decline in the number of switching devices.
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