This paper introduces a novel, to the best of our knowledge, method to estimate and compensate the nonlinear gamma factor introduced by the optical system in fringe projection profilometry. We propose to determine this factor indirectly by adjusting the least-squares plane to the estimated phase coming from the reference plane. We only require a minimal set of three fringe sinusoidal images to estimate the gamma factor. This value can be used to rectify computational legacy data and also to generate and project the new set of fringe patterns for which we perform the inverse gamma compensation. Experimental results demonstrate the feasibility of the proposed method to estimate and correct the gamma distortion.

We present a multiwavelength analysis of a wavefront detected by a color camera and a lateral shear interferometer. The system employs polarization phase-shifting techniques by rotating a linear polarizer at the output and detecting the phase information through a frequency demodulation algorithm. By considering the phase modulation obtained by rotating the analyzer, a frequency filter centered on the desired peak carries the phase and amplitude information of the detected wavefront. Theoretical approach, the consideration of Jones matrices of each element, and experimental results show the feasibility of the implementation.

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We developed simultaneous phase-shifting system based on a Mach-Zehnder interferometer and a replicating system integrated by a Michelson configuration and a cube beam splitter. The system is capable to obtain four simultaneous interferograms in a single capture, and the phase shifts are controlled by placing a linear polarizer in each replica obtained. The system retrieves four interferograms with a relative phase shift of π/2 and the optical phase map is calculated using the four-step algorithm. In addition, the configuration presents potential capabilities for generating spiral interference patterns. To show the advantage of the technique, experimental results are presented for static and dynamic samples.