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A Comparative Study of Random Patterns for Digital Image CorrelationDigital Image Correlation (DIC) is a computer based image analysis technique utilizing random patterns, which finds applications in experimental mechanics of solids and structures. In this paper a comparative study of three simulated random patterns is done. One of them is generated according to a new algorithm, introduced by the authors. A criterion for quantitative evaluation of random patterns after the calculation of their autocorrelation functions is introduced. The patterns' deformations are simulated numerically and realized experimentally. The displacements are measured by using the DIC method. Tensile tests are performed after printing the generated random patterns on surfaces of standard iron sheet specimens. It is found that the new designed random pattern keeps relatively good quality until reaching 20% deformation.

Abstract. This paper presents a roughness measurement of zirconia ceramics, widely used for dental applications. Surface roughness variations caused by the most commonly used dental instruments for intraoral grinding and polishing are estimated. The applied technique is simple and utilizes the speckle properties of the scattered laser light. It could be easily implemented even in dental clinic environment. The main criteria for roughness estimation is the average speckle size, which varies with the roughness of zirconia. The algorithm used for the speckle size estimation is based on the normalized autocorrelation approach.

The possibilities of stabilization of the interference pattern by filtration of a random-phase noise caused by vibrations, turbulence, and other local changes in the wave front in interferometric measurements are investigated. Dynamic holographic recording in photorefractive Bi(12)TiO(20) crystals is used. The parameters of the holographic recording are presented for determination of the dynamic range for filtering. Noise filtering takes place in real time and contributes to the enhancement of the contrast and the signal-to-noise ratio of the interference pattern. This results in a considerable increase in the sensitivity and the accuracy of the interferometric measurements.

We describe a spectral Stokesmeter: a device for fast simultaneous measurement of the four Stokes parameters of light. It consists of an original optical part, a four-channel scanning optoelectronic system, and a controlling computer system. The original optical scheme was first proposed by us. It is based on two holographic gratings, one of which is a special type of polarization grating. It allows an easy calibration of the device comprising wavelength and sensitivity calibration. The spectral range of the present implementation of the spectral Stokesmeter is 520-750 nm, and the error in the measurement of the normalized Stokes parameters is < or = 0.05.