We are experiencing an explosive growth in the number of consumer devices, including smartphones, tablets, web-based computers such as Chromebooks, and wearable devices. For this class of devices, energy efficiency is a first-class concern due to the limited battery capacity and thermal power budget. We find that data movement is a major contributor to the total system energy and execution time in consumer devices. The energy and performance costs of moving data between the memory system and the compute units are significantly higher than the costs of computation. As a result, addressing data movement is crucial for consumer devices. In this work, we comprehensively analyze the energy and performance impact of data movement for several widely-used Google consumer workloads: (1) the Chrome web browser; (2) TensorFlow Mobile, Google's machine learning framework; (3) video playback, and (4) video capture, both of which are used in many video services such as YouTube and Google Hangouts. We find that processing-in-memory (PIM) can significantly reduce data movement for all of these workloads, by performing part of the computation close to memory. Each workload contains simple primitives and functions that contribute to a significant amount of the overall data movement. We investigate whether these primitives and functions are feasible to implement using PIM, given the limited area and power constraints of consumer devices. Our analysis shows that offloading these primitives to PIM logic, consisting of either simple cores or specialized accelerators, eliminates a large amount of data movement, and significantly reduces total system energy (by an average of 55.4% across the workloads) and execution time (by an average of 54.2%).

The energy consumption of DRAM is a critical concern in modern computing systems. Improvements in manufacturing process technology have allowed DRAM vendors to lower the DRAM supply voltage conservatively, which reduces some of the DRAM energy consumption. We would like to reduce the DRAM supply voltage more aggressively, to further reduce energy. Aggressive supply voltage reduction requires a thorough understanding of the effect voltage scaling has on DRAM access latency and DRAM reliability. In this paper, we take a comprehensive approach to understanding and exploiting the latency and reliability characteristics of modern DRAM when the supply voltage is lowered below the nominal voltage level specified by DRAM standards. Using an FPGA-based testing platform, we perform an experimental study of 124 real DDR3L (low-voltage) DRAM chips manufactured recently by three major DRAM vendors. We find that reducing the supply voltage below a certain point introduces bit errors in the data, and we comprehensively characterize the behavior of these errors. We discover that these errors can be avoided by increasing the latency of three major DRAM operations (activation, restoration, and precharge). We perform detailed DRAM circuit simulations to validate and explain our experimental findings. We also characterize the various relationships between reduced supply voltage and error locations, stored data patterns, DRAM temperature, and data retention. Based on our observations, we propose a new DRAM energy reduction mechanism, called Voltron. The key idea of Voltron is to use a performance model to determine by how much we can reduce the supply voltage without introducing errors and without exceeding a user-specified threshold for performance loss. Our evaluations show that Voltron reduces the average DRAM and system energy consumption by 10.5% and 7.3%, respectively, while limiting the average system performance loss to only 1.8%, for a variety of memory-intensive quad-core workloads. We also show that Voltron significantly outperforms prior dynamic voltage and frequency scaling mechanisms for DRAM.

Main memory (DRAM) consumes as much as half of the total system power in a computer today, due to the increasing demand for memory capacity and bandwidth. There is a growing need to understand and analyze DRAM power consumption, which can be used to research new DRAM architectures and systems that consume less power. A major obstacle against such research is the lack of detailed and accurate information on the power consumption behavior of modern DRAM devices. Researchers have long relied on DRAM power models that are predominantly based off of a set of standardized current measurements provided by DRAM vendors, called IDD values. Unfortunately, we find that state-of-the-art DRAM power models are often highly inaccurate when compared with the real power consumed by DRAM. This is because existing DRAM power models (1) are based off of the worst-case power consumption of devices, as vendor specifications list the current consumed by the most power-hungry device sold; (2) do not capture variations in DRAM power consumption due to different data value patterns; and (3) do not account for any variation across different devices or within a device.

It has become increasingly difficult to understand the complex interactions between modern applications and main memory, composed of Dynamic Random Access Memory (DRAM) chips. Manufacturers are now selling and proposing many different types of DRAM, with each DRAM type catering to different needs (e.g., high throughput, low power, high memory density). At the same time, memory access patterns of prevalent and emerging applications are rapidly diverging, as these applications manipulate larger data sets in very different ways. As a result, the combined DRAM-workload behavior is often difficult to intuitively determine today, which can hinder memory optimizations in both hardware and software. In this work, we identify important families of workloads, as well as prevalent types of DRAM chips, and rigorously analyze the combined DRAM-workload behavior. To this end, we perform a comprehensive experimental study of the interaction between nine different DRAM types and 115 modern applications and multiprogrammed workloads. We draw 12 key observations from our characterization, enabled in part by our development of new metrics that take into account contention between memory requests due to hardware design. Notably, we find that (1) newer DRAM technologies such as DDR4 and HMC often do not outperform older technologies such as DDR3, due to higher access latencies and, also in the case of HMC, poor exploitation of locality; (2) there is no single memory type that can effectively cater to all of the components of a heterogeneous system (e.g., GDDR5 significantly outperforms other memories for multimedia acceleration, while HMC significantly outperforms other memories for network acceleration); and (3) there is still a strong need to lower DRAM latency, but unfortunately the current design trend of commodity DRAM is toward higher latencies to obtain other benefits. We hope that the trends we identify can drive optimizations in both hardware and software design. To aid further study, we open-source our extensively-modified simulator, as well as a benchmark suite containing our applications.

Variation has been shown to exist across the cells within a modern DRAM chip. Prior work has studied and exploited several forms of variation, such as manufacturing-process- or temperature-induced variation. We empirically demonstrate a new form of variation that exists within a real DRAM chip, induced by the design and placement of different components in the DRAM chip: different regions in DRAM, based on their relative distances from the peripheral structures, require different minimum access latencies for reliable operation. In particular, we show that in most real DRAM chips, cells closer to the peripheral structures can be accessed much faster than cells that are farther. We call this phenomenon design-induced variation in DRAM. Our goals are to i) understand design-induced variation that exists in real, state-of-the-art DRAM chips, ii) exploit it to develop low-cost mechanisms that can dynamically find and use the lowest latency at which to operate a DRAM chip reliably, and, thus, iii) improve overall system performance while ensuring reliable system operation. To this end, we first experimentally demonstrate and analyze designed-induced variation in modern DRAM devices by testing and characterizing 96 DIMMs (768 DRAM chips). Our experimental study shows that i) modern DRAM chips exhibit design-induced latency variation in both row and column directions, ii) access latency gradually increases in the row direction within a DRAM cell array (mat) and this pattern repeats in every mat, and iii) some columns require higher latency than others due to the internal hierarchical organization of the DRAM chip. Our characterization identifies DRAM regions that are vulnerable to errors, if operated at lower latency, and finds consistency in their locations across a given DRAM chip generation, due to design-induced variation. Variations in the vertical and horizontal dimensions, together, divide the cell array into heterogeneous-latency regions, where cells in some regions require longer access latencies for reliable operation. Reducing the latency uniformly across all regions in DRAM would improve performance, but can introduce failures in the inherently slower regions that require longer access latencies for correct operation. We refer to these inherently slower regions of DRAM as design-induced vulnerable regions. Based on our extensive experimental analysis, we develop two mechanisms that reliably reduce DRAM latency. First, DIVI Profiling uses runtime profiling to dynamically identify the lowest DRAM latency that does not introduce failures. DIVA Profiling exploits design-induced variation and periodically profiles only the vulnerable regions to determine the lowest DRAM latency at low cost. It is the first mechanism to dynamically determine the lowest latency that can be used to operate DRAM reliably. DIVA Profiling reduces the latency of read/write requests by 35.1%/57.8%, respectively, at 55C. Our second mechanism, DIVA Shuffling, shuffles data such that values stored in vulnerable regions are mapped to multiple error-correcting code (ECC) codewords. As a result, DIVA Shuffling can correct 26% more multi-bit errors than conventional ECC. Combined together, our two mechanisms reduce read/write latency by 40.0%/60.5%, which translates to an overall system performance improvement of 14.7%/13.7%/13.8% (in 2-/4-/8-core systems) over a variety of workloads, while ensuring reliable operation.