Low-temperature photoluminescence (PL) spectra of detector grade Cd1−xZnxTe (x=0.1) have been measured to obtain information about shallow level defect concentration introduced during mechanical polishing and chemical etching processes. We present here a comparative PL study of Cd0.9Zn0.1Te crystals treated by different chemical solutions used for nuclear detector surface treatment. The results show that the 5% Br–MeOH+2%Br–20% lactic acid in ethylene glycol treatment combines the advantages of bromine and lactic acid for chemical etching and results in the best surface condition, as evidenced by the largest I(D0,X)/Idef intensity ratio and the narrowest full width at half-maximum of the main peak (D0,X). Changes in the surface morphology were also analyzed by atomic force microscopy and correlated with the PL results. Current–voltage (I–V) curves and the room-temperature 55Fe spectral response of the sample etched by the best treatment are also presented and discussed.

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