Absolute electron-impact total ionization cross sections of chlorofluoromethanes Absolute partial cross sections for electron-impact ionization of NO and NO 2 from threshold to 1000 eV Absolute partial cross sections for electron-impact ionization of H 2 O and D 2 O from threshold to 1000 eV Absolute partial cross sections for the production of CH 4 ϩ , CH 3 ϩ , CH 2 ϩ , CH ϩ , C ϩ , H 2 ϩ , and H ϩ from electron-impact ionization of CH 4 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ions are completely collected. The overall uncertainty in the absolute cross section values is Ϯ3.5% for singly charged parent ions and is slightly greater for fragment ions. Although previous measurements are generally found to agree well with the present results for CH 4 ϩ and CH 3 ϩ , almost all previous work for the remaining fragment ions lies lower than the present results and in the case of H ϩ is lower by approximately a factor of 4.
Absolute partial cross sections for electron-impact ionization of CH4 from threshold to 1000 eV Absolute partial and total electron impact ionization cross sections for CF4 from threshold up to 180 eV Absolute partial electron impact ionization cross sections of Xe from threshold up to 180 eV J. Chem. Phys. 81, 3116 (1984); 10.1063/1.448013Mass spectrometric determination of partial electron impact ionization cross sections of He, Ne, Ar and Kr from threshold up to 180 eV Absolute partial cross sections for the production of CO 2 ϩ , CO ϩ , CO 2 2ϩ , O ϩ , C ϩ , O 2ϩ , and C 2ϩ from electron-impact ionization of CO 2 are reported for electron energies from threshold to 1000 eV. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output provides clear evidence that all product ions are completely collected. The overall uncertainty in the absolute cross section values is Ϯ3.5% for singly charged parent ions and is slightly greater for fragment and doubly charged ions. For the fragment ion cross sections, all but one of the previous measurements are observed to be significantly lower than the present results.
Absolute partial cross sections for electron-impact ionization of H2O and D2O are reported for electron energies from threshold to 1000 eV. Data are presented for the production of H2O++OH++O+, O2+, H2+, and H+ from H2O and for the production of D2O+, OD+, O+, O2+, D2+, and D+ from D2O. The product ions are mass analyzed using a time-of-flight mass spectrometer and detected with a position-sensitive detector whose output demonstrates that all product ions are completely collected. The overall uncertainty in the absolute cross section values is ±4.5% for singly charged parent ions and is slightly greater for fragment ions. The cross sections for H2O and D2O are found to be the same to within experimental uncertainties except for the H2+ cross section which is approximately a factor of 2 greater than the D2+ cross section. Previous results are compared to the present measurements.
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