Using automatic machine vision-based systems, the calibration of measuring instruments can be extended. With machine vision it is possible to check hundreds of points on the scale of a dial indicator, giving new insight into its sources of error. This paper describes a machine vision-based system for the calibration of dial indicators developed at the Centre for Metrology and Accreditation in Finland, with emphasis on the calculation of measurement uncertainty.

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The packaging of a miniaturized NIR-spectrometer is demonstrated. The heart of this NIR-spectrometer is an electrically tuneable silicon surface micromachined Fabry-Perot interferometer (FPI). For reliable operation, the FPI device has to be mounted so that thermo-mechanical stresses are not present in its active area. This can be realized basically by mounting FPI on a substrate that has a thermal expansion coefficient (TCE) close to silicon, using elastic material for mounting or minimizing the joint area between FPI and substrate. The FPI provides the possibility for the manufacturing of a miniaturized single-axis NIR-spectrometer for large-volume applications.

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