Mechanical behavior of carbon nanotubes in the rippled and buckled phase.
Journal of Applied Physics, 117(8): 084318Access to the published version may require subscription. N.B. When citing this work, cite the original published paper.
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We report measurements of the bending stiffness in free standing carbon nanotubes, using atomic force microscopy inside a scanning electron microscope. Two regimes with different bending stiffness were observed, indicative of a rippling deformation at high curvatures. The observed critical strains for rippling were in the order of a few percent and comparable to previous modeling predictions. We have also found indications that the presence of defects can give a higher critical strain value and a concomitant reduction in Young’s modulus.
The bending stiffness of individual, as-grown, vertically aligned carbon nanofibers was measured using a custom-built atomic force microscope placed inside a scanning electron microscope. The internal structure of the nanofiber was best modeled as dual-phase, composed of an inner graphitic core covered with a tapered amorphous carbon shell. It was found that the fibers have a relatively low bending stiffness, with Young's modulus values of about 10 GPa for the inner core and 65 GPa for the outer shell. The low Young's modulus of the inner core is attributed to a non-zero angle between the graphitic sheets and the nanofiber axis. The weak shear modulus between graphitic sheets thereby dominates the mechanical behaviour of the fibers. V
Image formation mechanisms in scanning electron microscopy of carbon nanotubes,and retrieval of their intrinsic dimensions.. , 124: 35-39 Access to the published version may require subscription. N.B. When citing this work, cite the original published paper.
Ultramicroscopy
Permanent link to this version:http://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-16425Image formation mechanisms in scanning electron microscopy of carbon nanotubes, and retrieval of their intrinsic dimensions.
AbstractWe present a detailed analysis of the image formation mechanisms that are involved in the imaging of carbon nanotubes with scanning electron microscopy (SEM). We show how SEM images can be modelled by accounting for surface enhancement effects together with the absorption coefficient for secondary electrons, and the electron-probe shape. Images can then be deconvoluted, enabling retrieval of the intrinsic nanotube dimensions. Accurate estimates of their dimensions can thereby be obtained even for structures that are comparable to the electron-probe size (on the order of 2 nm). We also present a simple and robust model for obtaining the outer diameter of nanotubes without any detailed knowledge about the electron-probe shape.
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