This paper discusses methodology of statistical simulation of an IC design which includes disturbances described by independent random variables, spatially correlated random disturbances and deterministic process parameters distribution on a wafer. The method of coupling of a processldevice simulator with a circuit extractor is proposed. Practical example of an operational amplifier design optimization is presented.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.