Waveguiding by total internal reflection is demonstrated within AlxGa1−xAs semiconductor heterostructures which have been fully oxidized in water vapor at ∼490 °C. Refractive index, mode propagation constant, propagation loss (⩽3 cm−1) at λ0=1.3 and 1.55 μm, secondary ion mass spectrometry depth profile, and Fourier transform infrared transmission spectra measurements are presented to characterize a multimode single-heterostructure oxide waveguide. An index contrast of Δn=0.06 is observed between oxidized x=0.4 and x=0.8 AlxGa1−xAs oxide layers. Absorption loss at 1.55 μm is observed due to OH groups. Near-field images are presented showing waveguiding in a single-mode oxide double heterostructure.

Extruded thin films of a liquid‐crystalline charge‐conjugated rigid‐rod polymer poly(p‐phenylenebenzobisthiazole), PBT, and a semicrystalline thermoplastic polyethylene‐terephthalate (Mylar) were fabricated and examined for film thickness, refractive index, and linear attenuation coefficient. Optical waveguide modes were successfully induced on the polymeric films using a prism coupler at λ = 633 and 1300 nm. Highly consistent thickness values were obtained for the polymeric films. In addition, the anisotropic nature of the optical properties was determined using TE and TM propagation modes. A refractive index as high as 2.3 was observed on PBT film. The refractive index data suggested that the PBT and Mylar films were optically anisotropic with refractive indices n⟂ (out‐of‐plane) invariably smaller than n∥ (in‐plane). Large anisotropy was also discovered in the linear attenuation coefficient α, with α∥/α⟂ ≈ 50 for the Mylar films. Complementary polarimetric and spectroscopic interference measurements were also applied to investigate the optical anisotropy of the extruded polymeric films. © 1992 John Wiley & Sons, Inc.

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