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Thin-film epitaxial structures of BaSi2, BaO, and BaTiO3, have been grown on the (001) face of silicon using ultrahigh vacuum, molecular beam epitaxy (MBE) methods. Source shuttering for the metal species coordinated with a pulsed, or cyclic, oxygen arrival at the growing oxide surfaces significantly improves film quality. The epitaxial growth of BaO is accomplished without silica formation at the BaO/Si interface by stabilizing BaSi2 as a submonolayer template structure. In situ ellipsometric measurements of the indices of refraction for BaO and for BaTiO3 in a BaTiO3/BaO/Si multilayer gave n=1.96 for BaO and n=2.2 for the BaTiO3, within 10% of their bulk values. These values suggest that this structure can be developed as an optical waveguide. BaO is impermeable to silicon for films as thin as 10 nm at temperatures as high as 800 °C, and good epitaxy can be obtained from room temperature to 800 °C. The epitaxy is such that BaTiO3(001)∥BaO(001)∥Si(001) and BaTiO 3〈110〉∥BaO〈100〉∥Si〈100〉.

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We report measurements of the refractive index of undoped yttrium aluminum garnet from 0.4 to 5.0 mum and the calculation of Sellmeier coefficients based on our data. The data differ considerably from previously published reports. The effect of the new data on the design of optical devices such as intracavity etalons for lasers is discussed.