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SrTiO 3 thin films were deposited on vitreous silica substrates at various substrate temperatures (300–700°C) by rf magnetron sputtering technique. The transition from amorphous phase to polycrystalline phase for the films occurred at the substrate temperatures of 300–400°C. Their optical properties were investigated by transmittance measurements. The fitting method was used to calculate the refractive index and the film thickness from the transparent region of the transmittance spectra. The refractive index increased and the film thickness decreased with the substrate temperatures increasing. The dispersion of the refractive index was studied by considering a single electronic oscillator model. The band gaps of the films were estimated from Tauc’s law and showed a decreasing tendency to that of the bulk SrTiO3 with the substrate temperatures increasing. These results provide some useful references for the potential application of SrTiO3 films in integrated optics devices.

The highly (l00) oriented Pb(Zr0.5Ti0.5)O3 thin films with different Fe3+ doping concentrations were fabricated on LaNiO3-coated silicon substrates by chemical solution deposition. And the microstructure, ferroelectric, leakage, and magnetic properties were investigated. The results indicate that incorporation of Fe3+ into PZT thin films can promote the degree of the lattice distortion and greatly improve the surface roughness. In comparison with the pure PZT sample, the ferroelectric hysteresis loops of Fe-doped PZT samples demonstrate larger and larger polarizations and coercive fields with the increase in Fe3+ doping amount. Moreover, leakage mechanism of present films evolves from the space charge limited conduction to the “modified” space charge limited conduction, and then returns to the space charge limited conduction with increasing Fe3+ doping concentration. The occurrence of exchange bias in these Fe-doped PZT samples implies that the magnetic exchange interaction can be explained by the bound magnetic polaron model.

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