Heteroepitaxial growth of GeSi alloys on Si ͑001͒ under deposition conditions that partially limit surface mobility leads to an unusual form of strain-induced surface morphological evolution. We discuss a kinetic growth regime wherein pits form in a thick metastable wetting layer and, with additional deposition, evolve to a quantum dot molecule-a symmetric assembly of four quantum dots bound by the central pit. We discuss the size selection and scaling of quantum dot molecules. We then examine the key mechanism-preferred pit formation-in detail, using ex situ atomic force microscopy, in situ scanning tunneling microscopy, and kinetic Monte Carlo simulations. A picture emerges wherein localized pits appear to arise from a damped instability. When pits are annealed, they extend into an array of highly anisotropic surface grooves via a one-dimensional growth instability. Subsequent deposition on this grooved film results in a fascinating structure where compact quantum dots and molecules, as well as highly ramified quantum wires, are all simultaneously self-assembled.
We propose and demonstrate a relaxed-SiGe/strained-Si (SiGe/s-Si) enhancement-mode gate stack for quantum dots. The enhancement-mode SiGe/s-Si structure is pursued because it spaces the quantum dot away from charge and spin defect rich dielectric interfaces and minimizes background dopants. A mobility of 1.6 × 10 5 cm 2 /Vs at 5.8 × 10 11 /cm 2 is measured in Hall bars that witness the same device process flow as the quantum dot. Periodic Coulomb blockade (CB) is measured in a double-top-gated lateral quantum dot nanostructure. The CB terminates with open diamonds up to ±10 mV of DC voltage across the device. The devices were fabricated within a 150 mm Si foundry setting that uses implanted ohmics and chemical-vapor-deposited dielectrics, in contrast to previously demonstrated enhancement-mode SiGe/s-Si structures made with AuSb alloyed ohmics and atomic-layer-deposited dielectric. A modified implant, polysilicon formation and annealing conditions were utilized to minimize the thermal budget so that the buried s-Si layer would not be washed out by Ge/Si interdiffusion.
Thin films of the molecular magnet Mn12-acetate, [Mn12 O12(CH3COO)16 (H2O)4]
2CH3COOH 4H2O, have been prepared using a laser ablation technique with a
nitrogen laser at low laser energies of 0.8 and 2 mJ. Chemical and magnetic
characterizations show that the Mn12-acetate cores remain intact and the films
show similar magnetic properties to those of the parent molecular starting
material. In addition, the magnetic data exhibit a peak in the magnetization at
27 K indicating the creation of an additional magnetic phase not noted in
previous studies of crystalline phases.Comment: 8 pages, 5 figures, In Press - J. Mag. Mag. Ma
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