In this paper, we present a new residue number system (RNS) {2 n − 1, 2 n , 2 n + 1, 2 n+1 + 1, 2 n−1 + 1} of five wellbalanced moduli that are co-prime for odd n. This new RNS complements the 5-moduli RNS system proposed before for even n {2 n − 1, 2 n , 2 n + 1, 2 n+1 − 1, 2 n−1 − 1}. With the new set, we also present a novel approach to designing multimoduli reverse converters that focuses strongly on moving a significant amount of computations off the critical path. The synthesis of the resulting design over the ST Microelectronics 65nm LP library demonstrates that the delay, area, and power characteristics improve the performance and power consumption of the existing complementary 5-moduli set.

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This paper introduces a new approach to estimate life distributions at nominal conditions from the results of accelerated life testing of electrical insulating materials. A very general family of probability distributions is introduced and a best fit member of this family is used to represent life data at each stress level. Nonlinear optimization techniques are applied in conjunction with linear regression analysis. In any accelerated life testing study important questions pertain to the minimal and maximal stress levels to be applied. A method of determination of the minimal stress level as well as the suitable number of tests based on reliability considerations is presented in the paper. A numerical example based on actual test data and a user-friendly computer program are presented.