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The capability to generate up to 1 V pure AC signals based on quantum standards marked a milestone on electrical metrology opening new applications that were not possible without this standard. Frequency response characterization of analog-to-digital converters (ADC) is fundamental for precision digital metrology. Several methods have been investigated for this characterization based on thermal converters, programmable Josephson voltage standard or input impedance measurements. This paper describes the method, the results obtained and the uncertainty estimation for the characterization of the amplitude frequency response at different aperture times of the DCV sampling function of the Keysight 3458-A using, for the first time, a Josephson arbitrary waveform synthesizer. This new standard allows one to extend the characterization to a higher frequency range and lower aperture times. The results show that the frequency response does not depend on aperture time and the same frequency correction can be applied in an extended frequency range. The knowledge of this correction will facilitate the application of the ADCs to higher frequencies, where low aperture times are required with accuracy in the order of V/V.

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A method to compensate the influence in amplitude and phase of the Analog-to-Digital Converters (ADC) and transducers used in the CEM sampling wattmeter, has been evaluated. The influence of the ADC has been tested and an algorithm to compensate for amplitude and phase has been implemented. Similar algorithm has been also developed to compensate for the influence of the shunts and resistive dividers. This method will improve the precision of the CEM digital sampling wattmeter, especially in the presence of high frequency harmonics. This paper describes the CEM digital sampling wattmeter, the evaluation of the influence of the ADC and transducer and the implemented algorithms.Index Terms -Power measurements, Sampling wattmeter, analogical to digital converters, ac shunts, resistive dividers.