Study of Keysight 3458A Temperature Coefficient for Different Aperture Times in DCV Sampling Mode

Sandoval, F.; Joya, Gonzalo; Sanmamed, Yolanda A.; Caballero, Raúl; Neira, Miguel; Garcìa-Lagos, Francisco; Salinas, J. R.; Aguilar, Javier Diaz de

doi:10.1109/cpem.2018.8500883

Cited by 3 publications

(5 citation statements)

References 4 publications

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“…The influence of the temperature in the amplitude, referred in other papers [35], especially for aperture times below 100 µs, needs further investigation. Without this knowledge in this paper it has been assumed that temperature and other input quantities are no correlated.…”

Section: In Relation With T Imentioning

confidence: 84%

“…C T : To characterize the relation between the gain and the temper ature, a climatic chamber was used, the temper ature was varied from 20 °C to 26 °C in steps of 1 °C. Before performing the measurement, each temperature was maintained for sufficient time to stabilize the internal temperature of the DMM [35]. For each temperature a 1 V Zener reference was applied to the DMMs.…”

Section: In Relation With T Imentioning

confidence: 99%

“…The only possible mutual dependence of the uncertainty components comes from the temperature influence. The only information about this influence is in [35] and is related to the amplitude variation with temperature that is relevant for aperture times below 100 µs. The understanding of this influence needs further investigation and it is not possible to evaluate the temperature influence on each uncertainty component.…”

Section: In Relation With T Imentioning

confidence: 99%

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Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer

Aguilar

Salinas

Kieler

et al. 2019

Meas. Sci. Technol.

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The capability to generate up to 1 V pure AC signals based on quantum standards marked a milestone on electrical metrology opening new applications that were not possible without this standard. Frequency response characterization of analog-to-digital converters (ADC) is fundamental for precision digital metrology. Several methods have been investigated for this characterization based on thermal converters, programmable Josephson voltage standard or input impedance measurements. This paper describes the method, the results obtained and the uncertainty estimation for the characterization of the amplitude frequency response at different aperture times of the DCV sampling function of the Keysight 3458-A using, for the first time, a Josephson arbitrary waveform synthesizer. This new standard allows one to extend the characterization to a higher frequency range and lower aperture times. The results show that the frequency response does not depend on aperture time and the same frequency correction can be applied in an extended frequency range. The knowledge of this correction will facilitate the application of the ADCs to higher frequencies, where low aperture times are required with accuracy in the order of V/V.

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Section: In Relation With T Imentioning

confidence: 84%

Section: In Relation With T Imentioning

confidence: 99%

Section: In Relation With T Imentioning

confidence: 99%

See 1 more Smart Citation

Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer

Aguilar

Salinas

Kieler

et al. 2019

Meas. Sci. Technol.

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show abstract

“…The temperature influence on the frequency response of Keysight 3458A digitizers in DCV sampling mode has been studied in [64] for dc voltage references and in [65] for ac input signals up to 1 kHz.…”

Section: Static Gain Thermal Driftmentioning

confidence: 99%

A method for using Josephson voltage standards for direct characterization of high performance digitizers to establish AC voltage and current traceability to SI

Ireland

Reuvekamp²,

Williams³

et al. 2022

Meas. Sci. Technol.

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A method for traceability to SI for ac voltage and current based on high performance digitizers is presented. In contrast to the existing thermal-based methods, the proposed method utilizes direct traceability to quantum-based waveforms via the use of Josephson voltage systems. This allows not only a simplification of the traceability chain and reduced measurement times but also offers the potential for analysis of the ac voltage and current waveform spectral content, a feature which is not possible using thermal methods. Scaling of current and voltage is achieved by the use of current shunts and resistive voltage dividers respectively. Target operating ranges are up to 1 A and 100 V with a frequency range up to 1 kHz for both. The corresponding target uncertainty for this traceability route is 1 μVV-1 and 2 μAA-1 up to frequencies of 1 kHz. The traceability chain is described and various components are characterized to validate their suitability for this task. It is demonstrated that these uncertainty targets can be met under certain conditions. The use of multi-tone calibration waveforms is investigated to further reduce measurement time. An uncertainty analysis method based on simulation using real component performance data is demonstrated.

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“…The Spanish Metrology Centre (CEM) together with other NMIs have been working on this topic for some time: from the characterization of analog-to-digital converters (ADC) [3][4][5], to the description of quantum standards [6][7][8][9] and the combined use of ADC and quantum standards on the same measurement arrangement [10][11][12][13][14].…”

Section: Introductionmentioning

confidence: 99%

Feasibility of a digital counterpart of thermal-converter-based current step up

Peral¹,

Sanmamed²,

Aguilar³

2022

Proceedings of the 25th IMEKO TC4 International Symposium and 23rd International Workshop on ADC and DAC Modelling and Testing

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The development of a new traceability stepup chain using digital instruments (digitisers) with direct traceability to SI would allow dynamic measurements of current and voltage waveforms. CEM has studied the feasibility of a digital counterpart for the traditional thermal-converter-based step up, which is limited to provide the RMS values of monotone signals. This paper describes and validates this new digital method, obtaining a complete set of calibrations shunt-digitizer for currents up to 1 A. The performed measurements show very promising results, comparable to the well-established thermal-converter approach results, with differences between both techniques lower than 2 μA/A up to 1 kHz.

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Study of Keysight 3458A Temperature Coefficient for Different Aperture Times in DCV Sampling Mode

Cited by 3 publications

References 4 publications

Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer

Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer

A method for using Josephson voltage standards for direct characterization of high performance digitizers to establish AC voltage and current traceability to SI

Feasibility of a digital counterpart of thermal-converter-based current step up

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