Stress and strain in thin films of Pr0.1Ce0.9O2-δ, supported on yttria stabilized zirconia (YSZ) and sapphire substrates, induced by large deviations from oxygen stoichiometry (δ = 0) were investigated by in situ high temperature X-ray diffraction and wafer curvature studies. The measured stresses and strains were correlated with change in δ, measured in situ using optical transmission spectroscopy of defect centers in the films and compared with prior chemical capacitance studies. The coefficient of chemical expansion and elastic modulus values for the films were found to be 18% less than, and 16% greater than in the bulk, respectively. Irreproducible stress and strain during cycling on YSZ substrates was observed and related to microstructural changes as observed by TEM. The enthalpy of defect formation was found to be similar for films supported on sapphire and YSZ, and appeared to decrease with tensile stress, and increase with compressive stress. Larger stresses observed for YSZ supported films as compared to sapphire supported films were found and accounted for by the difference in film orientations.

Real time monitoring of stress evolution in electrodes during electrochemical cycling can help quantify the driving forces that dictate their mechanical degradation. In the present work, in-situ stress evolution in thin films of spinel Li1+xMn2O4 (LMO) was measured by monitoring the change in the elastic substrate curvature during electrochemical cycling in a specially designed beaker cell in the 3.5–4.3 V (vs. Li/Li+) voltage range. The LMO thin films were prepared using a solution deposition technique and their structures and morphologies were characterized by X-ray diffraction (XRD), Raman spectroscopy and scanning electron microscopy (SEM). The stress evolution in the early part of the first delithiation cycle (<4.05 V) was consistent with the XRD data. However, stress evolution during later stages of the first delithiation cycle (>4.05 V) was not consistent with the XRD results, and showed irreversible behavior, suggesting irreversible changes in the electrode. Beyond the first delithiation cycle, the stress evolution was reversible, with a steady buildup of compressive and tensile stress during lithium insertion and extraction, respectively. Measurements on LMO films of varying thicknesses suggest that the first cycle irreversibility in stress response arises primarily from the electrode bulk.

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