The surface structure of a model system was measured in real space by atomic force and optical microscopies, and compared with that obtained from measurements in reciprocal space by x-ray reflectivity and off-specular scattering at grazing incidence. Experiments were performed on films of symmetric diblock copolymers of polystyrene and polymethylmethacrylate, whose surfaces were covered by micrometer-size islands or holes (domains) of uniform height. The correlation functions extracted from the images of the film surfaces show weak peaks in the real-space domain distribution. The corresponding structures were also found in reciprocal space. The height of the domains obtained from the scattering measurements was found to be in excellent agreement with that obtained by atomic force microscopy. We developed a formalism using the kinematical approximation for the analysis of the x-ray-scattering measurements. We used a multilayer film model with roughness at each interface and relief domains at the surface. We extracted the domain–domain correlation functions for the x-ray-scattering analysis from the atomic force and optical microscopy images.

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X1A: Secondgeneration undulator beamlines serving soft xray spectromicroscopy experiments at the NSLS Rev. Sci. Instrum. 67, 3359 (1996); 10.1063/1.1147466 XSCAN xray data acquisition and analysis software for the MATRIX X18A xray scattering beamline at the NSLS Rev.An energy dispersive x-ray absorption spectroscopy instrument has been built at the X6A beam port of the x-ray ring at the National Synchrotron Light Source (NSLS) . This instrument allows the collection of extended x-ray-absorption fine structure and/or x-ray absorption near-edge structure spectra for many elements on the millisecond time scale. The beamline employs a four-point crystal bender and a rectangular Si 220 crystal to access incident energies between 6.5 and 21 keV. Because the polychromator focuses the synchrotron beam to a narrow lOO+m line, this experimental apparatus is ideal for x-ray absorption spectroscopy experiments in special environments such as at high pressures, for in situ experiments, and/or for very small samples. In this manuscript we will describe the instrument design and present data with which to evaluate the instrument. This beamline is available through the NSLS user proposal system.

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