reasoning is one of the defining characteristics of human intelligence and can be estimated by visual IQ tests such as Raven's Progressive Matrices. In this paper, we propose using a hierarchical Transformer encoder with structured representation that employs a novel neural network architecture to improve both perception and reasoning in a visual IQ test. For perception, we used object detection models to extract the structured features. For reasoning, we used the Transformer encoder in a hierarchical manner that fits the structure of Raven's Progressive Matrices. Experimental results on the RAVEN dataset, which is one of the major large-scale datasets on Raven's Progressive Matrices, showed that our proposed architecture achieved an overall accuracy of 99.62%, which is an improvement of more than 8% points over CoPINet, the present-day, state-of-the-art neural network model.
PurposeThe purpose of this paper is to identify the root cause of low yield problems in the semiconductor manufacturing process using sensor data continuously collected from manufacturing equipment and describe the process environment in the equipment.Design/methodology/approachThis paper proposes a sensor data mining process based on the sequential modeling of random forests for low yield diagnosis. The process consists of sequential steps: problem definition, data preparation, excursion time and critical sensor identification, data visualization and root cause identification.FindingsA case study is conducted using real-world data collected from a semiconductor manufacturer in South Korea to demonstrate the effectiveness of the diagnosis process. The proposed model successfully identified the excursion time and critical sensors previously identified by domain engineers using costly manual examination.Originality/valueThe proposed procedure helps domain engineers narrow down the excursion time and critical sensors from the massive sensor data. The procedure's outcome is highly interpretable, informative and easy to visualize.
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