SUMMARYThe frequency-domain-based realization condition related to a novel non-invasive chaos control is presented in this paper. According to the common piecewise-linear characteristics of PWM-controlled DC-DC converter system, a general expression for its Jacobian matrix is derived for optimizing the control parameters of the proposed non-invasive chaos control. The relevant simulation and experiment results about the application of the chaos control to a voltage-mode Buck converter are given, which confirm the feasibility of the parameter-optimization method and the validity of the proposed non-invasive chaos control.

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SummaryThis paper presents a new additional perturbation control method for suppressing low‐frequency oscillation in voltage‐mode H‐bridge DC–AC inverter. The stability boundary of the H‐bridge inverter is investigated from its small‐signal averaged model. High input voltage and light load would cause low‐frequency oscillation in this system. To this end, a filter‐based perturbation control (FBPC) is proposed for eliminating this oscillation, by using an analog filter to extract the unexpected signal and applying it to the control loop. Theoretical results show a larger stability range of the controlled system with the proposed FBPC. The simulation and experiment results show that the proposed controller can control the low‐frequency oscillation in H‐bridge DC–AC inverter well. Copyright © 2014 John Wiley & Sons, Ltd.

Chip fatigue inside an insulated gate bipolar transistor (IGBT) module is a kind of incipient defect. It can be considered as an indication of the impending failure, and is utmost important for the safe operation of IGBT modules. Therefore, monitoring the chip fatigue is one of crucial measures to enhance the operating reliability of IGBT modules. This paper presents a prognostic approach for the chip fatigue based on grey relational analysis (GRA), which using dynamic change of the gate voltage as precursor parameter. This dynamic change is caused by aging of the intrinsic parasitic elements involved in gate drive circuit, which reflect the advent of chip fatigue. Grey relational grade is employed in this proposed prognostic approach to quantify the extent of those dynamic changes by little data, and find out potential chip fatigue. Then the operator would have a chance to schedule the maintenance and replace defective IGBT modules timely to avoid wear out. So it can be seen as a prefault diagnostic method. Finally, a confirmatory experiment is also carried out, and the correctness of the proposed approach is verified. Index tems-Power electronics, insulated gate bipolar transistor (IGBT), reliability, chip fatigue, grey relational analysis (GRA) I.