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Alpha, neutron, and heavy-ion single-event measurements were performed on both high-performance and hardened flip-flop designs in a 28-nm bulk CMOS technology. The experimental results agree very well with simulation predictions and confirm that event error rates can be reduced dramatically using effective layout design.Index Terms-Dual-interlocked cell (DICE), Layout design through Error Aware Positioning (LEAP), radhard design methodology, radiation hardening, radiation hardening by design, single-event effect, single-event upsets (SEU), soft error.

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Device-level simulation capabilities have been developed to self-consistently model the Si-nanowire (NW) biosensor systems. Our numerical study demonstrates that by introducing electro-diffusion current flow in the electrolyte solutions, the electrostatic screening of the biological charge can be significantly suppressed; an improvement of the sensed signal strength by >≈10X is indicated. Based on such an operation principle, the screening-induced performance limits on Si-NW biosensors can be overcome.