The imaging properties of various scintillation screens were investigated for ion beams extracted from the heavy ion synchrotron SIS 18 at GSI. Different ion beams such as C, Ne, Ar, Ta and U with initial kinetic energy of about 300 MeV/u were applied to various scintillation screens with particle fluxes ranging from 10 to 10 particles per pulse typically within 0.3 s pulse length. The scintillation process was observed with a digital Charge Coupled Device (CCD) camera. The performed study compares the light output, the beam profiles, and the image deformation of various scintillating screens for different ion beams. The light output scales linearly with respect to the ion beam flux over five orders of magnitude for the sensitive scintillation screens and ceramics like Al O , Al O :Cr. The highest light output was observed for CsI:Tl, and the lowest was recorded for Herasil. At higher beam intensities, non linear behavior of light output was observed for Mg and Y doped ZrO samples. The recorded beam profiles showed differences in width up to 50%, depending on the screen material.Index Terms-Ion irradiation, ion beam profile, particle beam instrumentation, scintillation devices, scintillation light yield, transverse profile.

Investigation of the parameters variation over the abrasive water jet machining of aluminium 2014 alloy was studied using the Taguchi technique. Traverse speed, standoff distance, pressure and mass flow rate were considered as the process parameters and were varied at three levels. The depth of cut was taken as the response, and it was measured and analysed statistically. The optimal parameters to achieve the maximum depth of cut were identified with the main effect plot. Most influencing parameters over the depth of cut were identified with the analysis of variance and response table. A mathematical relationship was developed to predict the depth of cut.