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We study extreme and critical events in the forced Liénard systems with charge control memristor. It has been found that the system exhibits hidden attractors either in the absence or presence of an external sinusoidal force. We give evidence that these attractors play a crucial role in the appearance of critical events. We attempt to explain the mechanism leading to the emergence of catastrophic transitions. Finally, we present that the observed critical transitions are typical for memristor based models and understanding of them gives some insight on how to avoid these types of devastating events at the time of the device fabrication process.

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